The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2024

Filed:

Jan. 14, 2020
Applicant:

Landmark Graphics Corporation, Houston, TX (US);

Inventors:

Robello Samuel, Cypress, TX (US);

Vanessa Ndonhong Kemajou, Spring, TX (US);

Assignee:

LANDMARK GRAPHICS CORPORATION, Houston, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
E21B 44/00 (2006.01); E21B 7/04 (2006.01); E21B 21/08 (2006.01); E21B 47/00 (2012.01);
U.S. Cl.
CPC ...
E21B 44/00 (2013.01); E21B 7/04 (2013.01); E21B 21/08 (2013.01); E21B 47/00 (2013.01); E21B 2200/20 (2020.05);
Abstract

Systems, methods, and computer-readable media are provided for rig monitoring and in particular, to receiving data from a plurality of sensors in real-time, mapping the data from the plurality of sensors with a micro-activity and a macro-activity, generating a message based on the mapping of the data from the plurality of sensors with the micro-activity and the macro-activity, selecting a parameter to be compared with a bit depth, tuning the parameter and the bit depth with a corresponding model based on the message, generating a parameter uncertainty array and a bit depth uncertainty array based on the tuning of the parameter and the bit depth, and generating dynamic uncertainty ellipses based on the parameter uncertainty array and the bit depth uncertainty array.


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