The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2024

Filed:

Feb. 03, 2022
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventor:

Hiroki Nakayama, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/02 (2006.01); A61B 6/00 (2006.01); A61B 6/06 (2006.01); A61B 6/40 (2024.01); A61B 6/46 (2024.01); A61B 6/50 (2024.01); A61B 6/58 (2024.01); G06T 7/73 (2017.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
A61B 6/025 (2013.01); A61B 6/06 (2013.01); A61B 6/4007 (2013.01); A61B 6/463 (2013.01); A61B 6/465 (2013.01); A61B 6/502 (2013.01); A61B 6/5205 (2013.01); A61B 6/587 (2013.01); G06T 7/74 (2017.01); G06T 11/005 (2013.01);
Abstract

A radiography system includes a correction marker that is used to obtain a marker image included in at least one of a plurality of projection images obtained by tomosynthesis imaging, is provided in an irradiation path of radiation in a radiation emitting unit, and is disposed at the position where the marker image is included in a region other than a reconstructed region in the projection image, the reconstructed region being a region used in a case in which the tomographic image is reconstructed from the plurality of projection images among the regions included in the plurality of projection images.


Find Patent Forward Citations

Nakayama, Hiroki. (2024). Radiography system, image processing device, image processing method, and image processing program (U.S. Patent No. 12023183). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12023183

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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