The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 2024
Filed:
May. 20, 2014
Shimadzu Corporation, Kyoto, JP;
Akihiro Ishikawa, Kyoto, JP;
Yoshihiro Inoue, Kyoto, JP;
Shumpei Yamaguchi, Kyoto, JP;
Haruo Uno, Kyoto, JP;
Takashi Amita, Kyoto, JP;
Yoshinori Masuda, Otsu, JP;
Haruhide Udagawa, Kyoto, JP;
SHIMADZU CORPORATION, Kyoto, JP;
Abstract
This optical measurement systemis provided with a plurality of optical measurement unitsand a control devicethat controls the optical measurement unit. The control device includes a communication unitthat obtains specific state informationon whether or not the optical measurement unit is in a measurable state by communication for each of a plurality of optical measurement units, a display unitthat collectively displays the obtained state information for each of the plurality of optical measurement units, and a control unitthat controls a plurality of optical measurement units so that a simultaneous measurement is performed.