The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 25, 2024
Filed:
Oct. 13, 2022
Samsung Electronics Co., Ltd., Suwon-si, KR;
Shinki Jeong, Hwaseong-si, KR;
Junyeon Won, Seoul, KR;
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
Abstract
A test device includes a comparison circuit configured to receive a plurality of input signals and generate a plurality of comparison signals based on the plurality of input signals; and a field programmable gate array (FPGA) configured to recover clock data, based on the plurality of comparison signals, wherein the FPGA includes a sampling circuit configured to generate a plurality of sample data signals by sampling the plurality of comparison signals; an edge extraction circuit configured to generate a plurality of edge data signals, based on logic values of bits in the plurality of sample data signals; an edge combining circuit configured to generate combined edge data by performing a logic operation on the plurality of edge data signals; and a filter circuit configured to recover the clock data by filtering the combined edge data.