The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 25, 2024

Filed:

Dec. 14, 2020
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Yuk L. Chan, Rochester, NY (US);

Anuja Deedwaniya, Poughkeepsie, NY (US);

Robert M. Abrams, Wappinger Falls, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 29/06 (2006.01); G06F 16/901 (2019.01); H04L 9/40 (2022.01);
U.S. Cl.
CPC ...
H04L 63/1425 (2013.01); G06F 16/9024 (2019.01);
Abstract

Examples described herein provide a computer-implemented method that includes receiving a list of objects with anomaly detection results associated therewith. The method further includes generating a resource graph, wherein the resource graph comprises at least two nodes, each of the at least two nodes being associated with one of the objects. The method further includes determining a relationship between the at least two nodes. The method further includes assigning an anomaly score to at least one of the objects. The method further includes calculating for at least one of the nodes, an overall anomaly score for the at least one of the nodes based on the anomaly score for the at least one of the objects and based on the anomaly score for another node related to the at least one of the nodes.


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