The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 25, 2024
Filed:
Mar. 16, 2023
Keysight Technologies, Inc., Santa Rosa, CA (US);
Christian Paul Sommers, Bangor, CA (US);
Kingshuk Mandal, Kolkata, IN;
KEYSIGHT TECHOLOGIES, INC., Santa Rosa, CA (US);
Abstract
A method for testing a link allocation (LA) implementation, the method comprising: at a test system for testing a system under test (SUT): determining at least one LA implementation parameter usable for modifying an LA implementation of the SUT; generating a test session plan for testing the SUT, wherein generating the test session plan includes determining a first plurality of test values for the at least one LA implementation parameter; and initiating, using the test session plan, a test session involving the SUT, wherein, during the test session, the test system causes the SUT to modify the LA implementation using at least one of the first plurality of test values.