The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 25, 2024

Filed:

Feb. 12, 2020
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Ashok Kumar Reddy Chavva, Bangalore, IN;

Sripada Kadambar, Bangalore, IN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 25/02 (2006.01); H04B 7/0408 (2017.01); H04L 5/00 (2006.01); H04W 72/04 (2023.01); H04W 72/044 (2023.01); H04W 74/00 (2009.01); H04W 74/08 (2024.01); H04W 74/0833 (2024.01);
U.S. Cl.
CPC ...
H04L 25/0224 (2013.01); H04B 7/0408 (2013.01); H04L 5/0048 (2013.01); H04W 72/046 (2013.01); H04W 74/006 (2013.01); H04W 74/0833 (2013.01);
Abstract

Methods and systems for tracking frequency offset in NR are provided. A user equipment (UE) can compute the frequency offset comprising of crystal frequency drift and Doppler shift. Drift in frequencies generated by crystal oscillators in the UE and a base station are detected and nullified. Doppler shift of a serving beam is estimated using either data collected by sensors in the UE or reference signals received from the base station. Values of Doppler shift for a plurality of beams are estimated using the Doppler shift of the serving beam and sensor data, wherein the serving beam and the plurality of beams correspond to a same transmitter beam or different transmitter beams, wherein the type of QCL of the beams is either A, B, or C.


Find Patent Forward Citations

Loading…