The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 25, 2024

Filed:

Jul. 17, 2020
Applicant:

Tmeic Corporation, Tokyo, JP;

Inventors:

Jintong Sun, Tokyo, JP;

Tetsuo Yoshimitsu, Tokyo, JP;

Hirotsugu Tsutsui, Tokyo, JP;

Kiyoshi Umezu, Tokyo, JP;

Assignee:

TMEIC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H02H 3/00 (2006.01); H02H 3/08 (2006.01); H03K 5/00 (2006.01); H03K 19/20 (2006.01); H03M 1/12 (2006.01);
U.S. Cl.
CPC ...
H02H 3/08 (2013.01); H03K 5/00 (2013.01); H03K 19/20 (2013.01); H03M 1/124 (2013.01); H03K 2005/00026 (2013.01);
Abstract

An impulse voltage generation device comprises: a high voltage generator to generate high DC voltage; a capacitor that is disposed in parallel to the high voltage generator and can be charged to a high voltage state; a power semiconductor switch that is placed at an output side of the high voltage generator and in series to the high voltage generator and is designed to shut off or allow electricity output from the high voltage generator; a function generator to output changes over time of impulse voltage to be applied to the test target; a current detector to detect output current; and an overcurrent protection circuit that is configured to conduct analog-to-digital conversion at sampling intervals sufficiently shorter than the application intervals when receiving a current signal from the current detector, monitors values of the output current, and to block output from the function generator to the power semiconductor switch if it is determined that there is an abnormality.


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