The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 25, 2024

Filed:

Jul. 06, 2022
Applicant:

SK Hynix Inc., Icheon-si, KR;

Inventors:

Gi Moon Hong, Icheon-si, KR;

Dae Han Kwon, Icheon-si, KR;

Assignee:

SK hynix Inc., Icheon-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 7/22 (2006.01); H03K 5/133 (2014.01); G11C 29/02 (2006.01); G11C 29/28 (2006.01);
U.S. Cl.
CPC ...
G11C 7/222 (2013.01); H03K 5/133 (2013.01); G11C 29/023 (2013.01); G11C 29/28 (2013.01); G11C 2207/2254 (2013.01);
Abstract

A semiconductor device includes a strobe transmission circuit configured to output an oscillation strobe signal, through a first delay path circuit, as a strobe signal when a first measurement operation is performed and configured to output the oscillation strobe signal through a second delay path circuit as the strobe signal when a second measurement operation is performed, and a calibration circuit configured to compare the number of times the strobe signal toggles during the first measurement operation to the number of times the strobe signal toggles during the second measurement operation to calibrate the delay amounts of the first and second delay path circuits to be the same.


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