The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 25, 2024

Filed:

Nov. 25, 2020
Applicant:

Sysmex Corporation, Kobe, JP;

Inventors:

Momoko Imakubo, Kobe, JP;

Jianyin Lu, Kobe, JP;

Kentaro Shirai, Kobe, JP;

Eri Katsumata, Kobe, JP;

Yuji Okamoto, Kobe, JP;

Assignee:

SYSMEX CORPORATION, Hyogo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06V 20/69 (2022.01); G01N 15/1429 (2024.01); G01N 15/1433 (2024.01); G01N 15/1434 (2024.01); G06T 7/00 (2017.01); G06V 10/70 (2022.01); G01N 15/00 (2006.01); G01N 15/10 (2006.01); G01N 15/14 (2006.01);
U.S. Cl.
CPC ...
G06V 20/69 (2022.01); G01N 15/1431 (2013.01); G01N 15/1433 (2024.01); G01N 15/1436 (2013.01); G06T 7/0012 (2013.01); G06V 10/87 (2022.01); G01N 2015/0019 (2013.01); G01N 2015/1028 (2024.01); G01N 2015/1495 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/10064 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30024 (2013.01);
Abstract

The present invention is to facilitate analysis of a plurality of analysis items. A cell analysis method for analyzing cells is provided in which data for analysis of cells contained in a sample are generated, and an artificial intelligence algorithm to be the input destination of the generated analysis data is selected from among a plurality of artificial intelligence algorithms, data indicating the properties of the cells are generated based on the analysis data via the artificial intelligence algorithm.


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