The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 25, 2024
Filed:
Feb. 26, 2021
Kabushiki Kaisha Toshiba, Tokyo, JP;
Yukinobu Sakata, Kawasaki, JP;
Kyoka Sugiura, Kawasaki, JP;
Ryusuke Hirai, Tokyo, JP;
Akiyuki Tanizawa, Kawasaki, JP;
KABUSHIKI KAISHA TOSHIBA, Tokyo, JP;
Abstract
According to one embodiment, a defect inspection apparatus includes a storage and a processor. The storage stores dictionary in which a first design image generated by software is associated with a first real image corresponding to the first design image. The processor acquires a second design image generated by the software. The processor searches for a similar first design image similar to the second design image. The processor generates a reference image that is a pseudo real image of a second inspection object, based on the second design data and free of defect, by using the first real image associated with the similar first design image. The first design image includes information of an image area wider than the first real image.