The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 25, 2024
Filed:
Jun. 11, 2021
GE Precision Healthcare Llc, Milwaukee, WI (US);
Gireesha Chinthamani Rao, Pewaukee, WI (US);
Alec Joseph Baenen, Hartland, WI (US);
Katelyn Rose Nye, Glendale, WI (US);
Prabhu Rajasekaran, Bangalore, IN;
Scott Schubert, Wales, WI (US);
Raghu Prasad, Bangalore, IN;
Keval Harishabhai Jagatiya, Rajkot, IN;
Aishwarya Seth, Bangalore, IN;
Eric Hart, Muskego, WI (US);
Adam Pluim, Brookfield, WI (US);
GE PRECISION HEALTHCARE LLC, Milwaukee, WI (US);
Abstract
The current disclosure provides methods and systems for rapidly and consistently determining medical image quality metrics following acquisition of a diagnostic medical image. In one embodiment, the current disclosure teaches a method for determining an image quality metric by, acquiring a medical image of an anatomical region, mapping the medical image to a positional attribute of an anatomical feature using a trained deep neural network, determining an image quality metric based on the positional attribute of the anatomical feature, determining if the image quality metric satisfies an image quality criterion, and displaying the medical image, the image quality metric, and a status of the image quality criterion via a display device. In this way, a diagnostic scanning procedure may be expedited by providing technicians with real-time insight into quantitative image quality metrics.