logo

For the Inventor, By the Inventor

The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12020256 B1

PDFFull Text
Date of Patent:
Jun. 25, 2024

Filed:

Jul. 27, 2021

Generation of divergence distributions for automated data analysis

Applicant:

Feedzai—consultadoria E Inovação Tecnológica, S.a., Coimbra, PT;

Inventors:

Marco Oliveira Pena Sampaio, Vila Nova de Gaia, PT;

Pedro Cardoso Lessa e Silva, Oporto, PT;

João Dias Conde Azevedo, Maia, PT;

Ricardo Miguel de Oliveira Moreira, Lisbon, PT;

João Tiago Barriga Negra Ascensão, Lisbon, PT;

Pedro Gustavo Santos Rodrigues Bizarro, Lisbon, PT;

Ana Sofia Leal Gomes, Lisbon, PT;

João Miguel Forte Oliveirinha, Loures, PT;

Assignee:

Feedzai—Consultadoria e Inovação Tecnológica, S.A., , PT;

Attorney:

Van Pelt, Yi & James LLP

Primary Examiner:

Bruce I Ebersman

Assistant Examiner:

Bhavin D Shah

Int. Cl.
CPC ...
G06Q 20/40 (2012.01); H04L 9/40 (2022.01);
U.S. Cl.
CPC ...
G06Q 20/4016 (2013.01);
Abstract

A set of data elements is received. For each feature of a set of features, a corresponding reference distribution for the set of data elements is determined. For each feature of the set of features, one or more corresponding subset distributions for one or more subsets sampled from the set of data elements are determined. For each feature of the set of features, the corresponding reference distribution is compared with each of the one or more corresponding subset distributions to determine a corresponding distribution of divergences. At least the determined distributions of divergences for the set of features are provided for use in automated data analysis.

Find Patent Forward Citations

Sampaio, Marco Oliveira Pena. (2024). Generation of divergence distributions for automated data analysis (U.S. Patent No. 12020256). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12020256

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…