The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 25, 2024

Filed:

Apr. 05, 2023
Applicant:

Inait SA, Lausanne, CH;

Inventors:

Henry Markram, Lausanne, CH;

Felix Schuermann, Grens, CH;

John Rahmon, Lausanne, CH;

Daniel Milan Lütgehetmann, Lausanne, CH;

Constantin Cosmin Atanasoaei, Chavannes-pres-Renens, CH;

Assignee:

INAIT SA, Lausanne, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/08 (2023.01); G06N 3/044 (2023.01); G06N 3/049 (2023.01);
U.S. Cl.
CPC ...
G06N 3/08 (2013.01); G06N 3/044 (2023.01); G06N 3/049 (2013.01);
Abstract

A method includes defining a plurality of different windows of time in a recurrent artificial neural network, wherein each of the different windows has different durations, has different start times, or has both different durations and different start times, identifying occurrences of topological patterns of activity in the recurrent artificial neural network in the different windows of time, comparing the occurrences of the topological patterns of activity in the different windows, and classifying, based on a result of the comparison, a first decision that is represented by a first topological pattern of activity that occurs in a first of the windows as less robust than a second decision that is represented by a second topological pattern of activity that occurs in a second of the windows.


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