The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 25, 2024
Filed:
Dec. 15, 2022
International Business Machines Corporation, Armonk, NY (US);
Petar Jurcevic, Yorktown Heights, NY (US);
Helena Zhang, White Plains, NY (US);
Lev Samuel Bishop, Dobbs Ferry, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method, system and computer program product for mitigating errors in measurements from a quantum system. A discriminator is trained to classify the measurement results of the quantum states of qubits as corresponding to a first quantum state (e.g., quantum state of 0) or a second quantum state (e.g., quantum state of 1). A first region of trust (corresponding to trusted measurements of a first quantum state) with a first discriminator boundary and a second region of trust (corresponding to trusted measurements of a second quantum state) with a second discriminator boundary are defined using the trained discriminator. If a shot-to-shot measurement result of a qubit state falls outside such regions of trust, the measurement result is rejected. In this manner, measurement errors from a quantum system are effectively mitigated, including measurement errors involving shot-to-shot measurement results of the quantum states read from the execution of the quantum circuits.