The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 25, 2024

Filed:

Aug. 25, 2021
Applicant:

Kabushiki Kaisha Toshiba, Tokyo, JP;

Inventors:

Hiro Gangi, Tokyo, JP;

Yasunori Taguchi, Kawasaki Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/367 (2020.01); G06F 30/398 (2020.01); G06N 7/01 (2023.01); G06N 20/00 (2019.01); G06F 119/06 (2020.01);
U.S. Cl.
CPC ...
G06F 30/398 (2020.01); G06N 7/01 (2023.01); G06F 2119/06 (2020.01);
Abstract

According to one embodiment, a design support method includes inputting a design value group to a simulator. The design value group includes design values relating to a semiconductor element. The method further includes acquiring a characteristic value group output from the simulator according to the input of the design value group. The characteristic value group includes characteristic values of the semiconductor element. The characteristic values include a first and a second characteristic values respectively indicating an on-resistance and a breakdown voltage. The method further includes calculating an acquisition function of a Bayesian inference from history data including not less than one data set. The data set includes the design value group and a score. The portion of the characteristic value group includes the first and second characteristic values. The method further includes generating a new design value group based on the acquisition function.


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