The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 25, 2024

Filed:

May. 26, 2022
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Kimio Hayashi, Tokyo, JP;

Yoshiji Kanamoto, Tokyo, JP;

Toshihiko Iida, Ibaraki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/12 (2006.01); G06T 7/00 (2017.01); H04N 1/32 (2006.01);
U.S. Cl.
CPC ...
G06F 3/1259 (2013.01); G06F 3/1207 (2013.01); G06T 7/0004 (2013.01); H04N 1/32545 (2013.01); H04N 1/32662 (2013.01); G06T 2207/30108 (2013.01); G06T 2207/30168 (2013.01);
Abstract

An information processing apparatus is provided, which performs: acquiring an inspection result obtained by inspecting quality of a print product; receiving quality request data including an evaluation criterion; specifying a quality level of the print product based on the evaluation criterion included in the quality request data and the inspection result; creating quality report data including the inspection result and the quality level; and transmitting the quality report data to a predetermined external apparatus.


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