The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 25, 2024

Filed:

Apr. 17, 2019
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Jerry Pan, Roswell, GA (US);

Jian Lin, Alphretta, GA (US);

Michael Josiah Bolding, Smyrna, GA (US);

Dominique J. Paster, Atlanta, GA (US);

Peihao Chen, Atlanta, GA (US);

Wesley Truett, Cumming, GA (US);

Timothy A. Thornburgh, Woodstock, GA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 21/55 (2013.01); G06F 17/15 (2006.01); G06F 18/214 (2023.01); G06F 18/2321 (2023.01); G06N 5/025 (2023.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06F 21/552 (2013.01); G06F 17/15 (2013.01); G06F 18/2148 (2023.01); G06F 18/2321 (2023.01); G06N 5/025 (2013.01); G06N 20/00 (2019.01); G06F 2221/2151 (2013.01);
Abstract

An approach is provided that receives event data that correspond to detected activities performed by a user on one of a set of one or more computer systems. The detected activities are performed by the user over a time duration. The approach analyzes the event data using time-based models. Each of the time-based models correspond to a different time interval that is included in the time duration. The analysis results in time-based risk scores pertaining to the user for each of the different time intervals. An action is then performed based on an overall security risk score of the user with the overall security risk score of the user being calculated based on the different time-based risk scores.


Find Patent Forward Citations

Loading…