The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 25, 2024
Filed:
Jul. 30, 2021
China Mobile Communication Co., Ltd Research Institute, Beijing, CN;
China Mobile Communications Group Co., Ltd., Beijing, CN;
Dan Song, Beijing, CN;
Luting Kong, Beijing, CN;
Nan Li, Beijing, CN;
Songhe Lu, Beijing, CN;
Xiaoxiong Song, Beijing, CN;
Jun Liu, Beijing, CN;
China Mobile Communication Co., Ltd Research Institute, Beijing, CN;
China Mobile Communications Group Co., Ltd., Beijing, CN;
Abstract
The present disclosure provides a testing method and a testing device. The testing method includes: configuring one or more testing parameters for a to-be-tested object, and performing at least two testing processes to obtain a testing value of each performance index for each testing process, each of the at least two testing processes being used to test different performance index of the to-be-tested object or to test different performance indices of the to-be-tested object; and generating a testing result of the to-be-tested object in accordance with the testing value of each performance index for each testing process. According to the present disclosure, it is able to perform the multi-dimensional test, thereby to meet the requirement on the performance indices in different scenarios, improve the testing efficiency, and increase the reliability of the testing result for true performance of a terminal.