The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 25, 2024

Filed:

Feb. 08, 2018
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Kumiko Tadano, Tokyo, JP;

Yoshiharu Maeno, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 19/418 (2006.01); G01C 21/34 (2006.01); G05D 1/00 (2006.01); B65G 1/137 (2006.01); H04L 67/12 (2022.01);
U.S. Cl.
CPC ...
G05D 1/0297 (2013.01); G01C 21/3407 (2013.01); G05B 19/418 (2013.01); B65G 1/1373 (2013.01); G05B 2219/31001 (2013.01); G05B 2219/31281 (2013.01); H04L 67/12 (2013.01);
Abstract

The present invention increases the productivity of an entire factory, even of the type that produces different types of products in different quantities using transport vehicles, by performing transport operation control. This transport operation control device is provided with: a spatial distribution measuring unit which measures the spatial distribution of products-in-process being transported by the transport vehicles; and an operation schedule calculation unit which, on the basis of the measured spatial distribution of the group of partly-finished products, calculates an operation schedule that specifies both a route and a frequency of a transport operation to be carried out by each transport vehicle of the transport vehicles, wherein the operation schedule calculation unit determines the timing with which to update the operation schedule, on the basis of changes in a productivity index that is determined from the measured spatial distribution of the products-in-process.


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