The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 25, 2024

Filed:

Mar. 22, 2021
Applicant:

Abb Schweiz Ag, Baden, CH;

Inventors:

Moncef Chioua, Heidelberg, DE;

Matthieu Lucke, Heidelberg, DE;

Emanuel Kolb, Gorxheimertal, DE;

Martin Hollender, Dossenheim, DE;

Nuo Li, Mannheim, DE;

Andrew Cohen, Mannheim, DE;

Assignee:

ABB Schweiz AG, Baden, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 23/02 (2006.01); G06F 17/15 (2006.01); G06F 17/18 (2006.01); G06F 18/22 (2023.01);
U.S. Cl.
CPC ...
G05B 23/0213 (2013.01); G06F 17/15 (2013.01); G06F 17/18 (2013.01); G06F 18/22 (2023.01); G06F 2218/12 (2023.01);
Abstract

A computer-implemented method for determining an abnormal technical status of a technical system includes: receiving, from the technical system, a plurality of signals, each signal being sampled over time and reflecting the technical status of at least one system component; computing, for each signal with associated high and low alarm thresholds obtained from an alarm management system, at every sampling time point, a univariate distance to its associated alarm thresholds as a maximum of the distances between a value of the respective signal and its associated alarm thresholds to quantify a degree of abnormality for the respective at least one system component; computing, at every sampling time point, based on the univariate distances at the respective sampling time points, an aggregate abnormality indicator reflecting the technical status of the technical system; and providing, to an operator, a comparison of the aggregate abnormality indicator with a predetermined abnormality threshold.


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