The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 25, 2024

Filed:

Dec. 28, 2021
Applicants:

Commissariat À L'energie Atomique ET Aux Energies Alternatives, Paris, FR;

Centre National DE LA Recherche Scientifique, Paris, FR;

Université Grenoble Alpes, Saint Martin d'heres, FR;

Inventors:

Marc Zelsmann, Biviers, FR;

Pierre Marcoux, Grenoble, FR;

Emmanuel Picard, Grenoble, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03H 1/08 (2006.01); G03H 1/04 (2006.01); G06T 5/50 (2006.01); H04N 23/56 (2023.01);
U.S. Cl.
CPC ...
G03H 1/0891 (2013.01); G03H 1/0443 (2013.01); G06T 5/50 (2013.01); H04N 23/56 (2023.01); G03H 2001/0452 (2013.01); G03H 2210/55 (2013.01); G03H 2226/02 (2013.01); G06T 2207/30004 (2013.01);
Abstract

A method for obtaining an image of a sample includes illuminating the sample using a light source; acquiring, using an image sensor, a first image of the sample, the image being formed in the detection plane, the first image being representative of an exposure light wave propagating, from the sample, to the image sensor, along a first optical path; modifying an optical refractive index, between the image sensor and the sample; acquiring a second image of the sample, the image being representative of the exposure light wave along a second optical path; and implementing an iterative algorithm that combines the first and second images so as to obtain an image of the sample.


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