The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 25, 2024

Filed:

Aug. 13, 2021
Applicant:

Fujifilm Business Innovation Corp., Tokyo, JP;

Inventors:

Yosuke Tsurumi, Minamiashigara, JP;

Sakiko Takeuchi, Minamiashigara, JP;

Karin Sakai, Minamiashigara, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03G 9/113 (2006.01); G03G 9/08 (2006.01); G03G 9/107 (2006.01); G03G 15/06 (2006.01); G03G 21/18 (2006.01);
U.S. Cl.
CPC ...
G03G 9/1139 (2013.01); G03G 9/0819 (2013.01); G03G 9/1075 (2013.01); G03G 9/1087 (2020.08); G03G 9/1133 (2013.01); G03G 15/06 (2013.01); G03G 21/1814 (2013.01);
Abstract

An electrostatic charge image developing carrier, containing: a magnetic particle; and a resin coating layer that coats the magnetic particle and contains inorganic particles, and the electrostatic charge image developing carrier has a surface roughness satisfying a ratio B/A of a surface area B to a plan view area A of 1.020 or more and 1.100 or less, the plan view area A and the surface area B being obtained by three-dimensional analysis of the surface, and the magnetic particle has a surface roughness satisfying 0.5 μm≤Sm≤2.5 μm and 0.3 μm≤Ra≤1.2 μm, and Sm represents an average ruggedness interval and Ra represents an arithmetic average surface roughness.


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