The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 25, 2024
Filed:
Nov. 17, 2022
Applicant:
Canon Kabushiki Kaisha, Tokyo, JP;
Inventor:
Kazuhiro Arai, Kanagawa, JP;
Assignee:
CANON KABUSHIKI KAISHA, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03G 15/04 (2006.01); G02B 3/02 (2006.01); G02B 3/08 (2006.01); G02B 26/08 (2006.01); G02B 3/00 (2006.01);
U.S. Cl.
CPC ...
G03G 15/04036 (2013.01); G02B 3/02 (2013.01); G02B 3/08 (2013.01); G02B 26/0816 (2013.01); G02B 2003/0093 (2013.01);
Abstract
A system includes a light source, a deflection unit configured to deflect a light beam having a wavelength λ emitted from the light source, and a lens unit including a plurality of lenses that focuses deflected light on a surface to be scanned, at least one lens among the plurality of lenses has a micro concavo-convex structure in an optical surface, and the optical surface having the micro concavo-convex structure has a transmittance distribution for the light beam having the wavelength λ according to a light quantity distribution of the deflected light and entering the lens unit.