The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 25, 2024

Filed:

Apr. 05, 2022
Applicant:

Oak Analytics Inc., Camarillo, CA (US);

Inventors:

Ruibo Wang, Camarillo, CA (US);

James F. Gass, Camarillo, CA (US);

Assignee:

Oak Analytics Inc., Camarillo, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G02B 6/14 (2006.01); G01J 3/04 (2006.01); G01J 3/44 (2006.01);
U.S. Cl.
CPC ...
G02B 6/14 (2013.01); G01J 3/04 (2013.01); G01J 3/4412 (2013.01);
Abstract

One embodiment provides an optical spectrometer. The optical spectrometer can include a lens-and-filter system configured to collect light scattered from a sample, a spot converter configured to convert a substantially circular beam outputted from the lens-and-filter system into a substantially rectangular beam, and a slit comprising a rectangular aperture to allow a predetermined portion of the substantially rectangular beam to enter the rectangular aperture while blocking noise. The slit can further include at least one microelectromechanical systems (MEMS)-based movable structure configured to adjust a width of the rectangular aperture.


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