The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 25, 2024
Filed:
Jul. 19, 2019
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Florian Fahrbach, Mannheim, DE;
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Abstract
A illumination arrangement for a microscope for illuminating a sample with a light sheet includes an illumination input configured to feed an illumination beam along an optical axis of the illumination arrangement and an illumination output which faces a sample side and is configured to output the illumination beam to the sample side. A focusing optical system is provided with a set depth of focus. At least one optical modification element is configured to geometrically modify the illumination beam. Different rays of the illumination beam intersect the optical axis within an axis intersection region at the illumination output. The axis intersection region extends over at least the depth of focus of the focusing optical system along the optical axis.