The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 25, 2024

Filed:

Jul. 13, 2023
Applicants:

SK Innovation Co., Ltd., Seoul, KR;

SK Earthon Co., Ltd., Seoul, KR;

Inventors:

Seungjoon Cha, Daejeon, KR;

Youngki Choi, Daejeon, KR;

Hee Jeong Jang, Daejeon, KR;

Kyoung Jin Lee, Daejeon, KR;

Hyunjong Cho, Gyeonggi-do, KR;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01V 1/28 (2006.01); E21B 47/04 (2012.01); G01V 1/30 (2006.01); G01V 1/50 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G01V 1/282 (2013.01); E21B 47/04 (2013.01); G01V 1/303 (2013.01); G01V 1/50 (2013.01); E21B 2200/20 (2020.05); G01V 1/284 (2013.01); G06N 20/00 (2019.01);
Abstract

Disclosed are a method and apparatus for estimating S-wave velocities by learning well logs, whereby the method includes a model formation step of forming an S-wave estimation model to output S-wave velocities corresponding to measured depth when the well logs are input based on train data sets including train data having values of multiple factors included in the well logs, the values being arranged corresponding to measured depth, and label data having S-wave velocities corresponding to measured depth as answers, and an S-wave velocity estimation step of inputting unseen data having values of multiple factors included in well logs acquired from a well at which S-wave velocities are to be estimated, the values being arranged corresponding to measured depth, to the S-wave estimation model to estimate S-wave velocities corresponding to measured depth.


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