The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 25, 2024

Filed:

Feb. 05, 2020
Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventors:

Yasushi Utsugi, Tokyo, JP;

Kuniaki Onizawa, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/04 (2006.01); G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
G01N 35/04 (2013.01); G01N 35/00594 (2013.01); G01N 2035/0403 (2013.01); G01N 2035/0493 (2013.01);
Abstract

Provided is a specimen treatment system that can detect whether a specimen container is uncapped by using a simple mechanism. The specimen treatment system comprises: an automatic analyzer that analyzes a specimen; a pretreatment device that performs a pretreatment on the specimen; and a conveyance passage that conveys, in the automatic analyzer or in the pretreatment device, a specimen container that houses the specimen. The specimen treatment system is characterized by further comprising a single sensor that is disposed so as to be orthogonal to the longitudinal direction of the specimen container and that detects whether the specimen container is uncapped.


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