The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 25, 2024
Filed:
May. 20, 2021
Nantbio, Inc., Culver City, CA (US);
Kayvan Niazi, Agoura Hills, CA (US);
Krsto Sbutega, Redondo Beach, CA (US);
NantBio, Inc., Culver City, CA (US);
Abstract
A computer-implemented method of using interferometry to detect mass changes of objects in a solution includes obtaining a time series of images using interferometry, and performing background correction on each image by classifying pixels of the image as background pixels or object pixels, fitting only the background pixels of the image to a function to generate a background fitted function, and subtracting the background fitted function from the image to generate a background corrected image. The method includes performing segmentation on the background corrected images to resolve boundaries of one or more objects, performing motion tracking on the objects to track changes in position of the objects, determining respective masses of the motion tracked objects and determining, for each image in the time series, an aggregate mass based on the respective masses to determine whether the aggregate mass of the motion tracked objects is increasing or decreasing.