The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 25, 2024
Filed:
Jul. 16, 2021
Rapiscan Holdings, Inc., Hawthorne, CA (US);
Simon Archambault, St-Laurent, CA;
Rapiscan Holdings, Inc., Hawthorne, CA (US);
Abstract
A method for detecting the maximum potential presence of a material in an object. The method includes obtaining raw x-ray image data comprising a plurality of pixels for the object from an X-ray scanning device, wherein each pixel of the plurality of pixels has associated therewith an attenuation value and an effective atomic number (Z) for the pixel. The method further includes converting, for each pixel having a Zvalue greater than a threshold effective atomic number (Z), the Zat the pixel to the Zwhile applying a correction factor to the attenuation value for the pixel to bring the attenuation value into correspondence with the conversion of the Zvalue for the pixel and determining a maximum potential amount of the material present at each pixel based on the corrected attenuation value at the pixel. This renders material more apparent in visual display.