The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 25, 2024

Filed:

Jun. 07, 2021
Applicant:

Okuma Corporation, Niwa-Gun, JP;

Inventor:

Yuji Mizoguchi, Niwa-Gun, JP;

Assignee:

Okuma Corporation, Niwa-Gun, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 21/16 (2006.01); G01M 99/00 (2011.01);
U.S. Cl.
CPC ...
G01B 21/16 (2013.01); G01M 99/005 (2013.01);
Abstract

An accuracy diagnostic device for a machine tool diagnoses an accuracy of the machine tool. The machine tool includes a change amount detection unit that measures a change amount. The change amount changes due to an installation environment and an operational motion. The accuracy diagnostic device includes a change-amount-reference-value recording unit that records a reference value of the change amount. The accuracy diagnostic device obtains the change amount measured by the change amount detection unit. The accuracy diagnostic device diagnoses a change of the accuracy of the machine tool based on a first change index derived from a magnitude of a change of the change amount per a predetermined period and a second change index derived from the current change amount and the reference value.


Find Patent Forward Citations

Mizoguchi, Yuji. (2024). Accuracy diagnostic device and accuracy diagnostic method for machine tool (U.S. Patent No. 12018933). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12018933

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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