The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 25, 2024
Filed:
Jan. 25, 2019
Applicant:
Friedrich-schiller-universitaet Jena (Fsu), Jena, DE;
Inventors:
Assignee:
FRIEDRICH-SCHILLER-UNIVERSITAET JENA, Jena, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B01D 15/32 (2006.01); B01J 20/283 (2006.01); B01J 20/291 (2006.01); G01N 30/02 (2006.01); G01N 30/74 (2006.01); G01N 30/86 (2006.01); G01N 30/88 (2006.01);
U.S. Cl.
CPC ...
B01D 15/325 (2013.01); B01J 20/283 (2013.01); G01N 30/74 (2013.01); G01N 30/8631 (2013.01); B01J 20/291 (2013.01); G01N 2030/027 (2013.01); G01N 2030/8872 (2013.01);
Abstract
Disclosed is a method for the determination of impurities in polyalkylene ethers and polyalkylene amines comprising the steps The method allows in an easy manner to identify impurities in the sample. The method can be used for quality control but also for the preparative cleaning of the sample.