The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 25, 2024

Filed:

Mar. 11, 2022
Applicant:

Canon Medical Systems Corporation, Tochigi, JP;

Inventors:

Ting Xia, Vernon Hills, IL (US);

Liang Cai, Vernon Hills, IL (US);

Jian Zhou, Vernon Hills, IL (US);

Zhou Yu, Vernon Hills, IL (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2024.01); A61B 6/02 (2006.01); A61B 6/03 (2006.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
A61B 6/544 (2013.01); A61B 6/5258 (2013.01); G06T 11/008 (2013.01); A61B 6/025 (2013.01); A61B 6/032 (2013.01); G06T 2200/04 (2013.01); G06T 2210/41 (2013.01);
Abstract

A method, apparatus, and computer-readable storage medium for controlling exposure/irradiation during a main three-dimensional X-ray imaging scan using at least one spatially-distributed characteristic of a pre-scan/scout scan preceding the main scan. The at least one spatially-distributed characteristic includes (1) a spatially-distributed noise characteristic of the pre-scan and/or (2) a spatially-distributed identification of exposure-sensitive tissue types. The at least one spatially-distributed characteristic can be calculated from images reconstructed from sinogram/projection data and/or from sinogram/projection directly using a neural network.


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