The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 18, 2024

Filed:

Jan. 31, 2023
Applicant:

Airties S.a.s., Paris, FR;

Inventors:

Muharrem Sarper Gokturk, Istanbul, TR;

Metin Ismail Taskin, Istanbul, TR;

Assignee:

AIRTIES S.A.S., Paris, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 40/12 (2009.01); H04B 17/309 (2015.01); H04L 43/0888 (2022.01); H04L 45/12 (2022.01); H04L 45/125 (2022.01); H04W 40/28 (2009.01);
U.S. Cl.
CPC ...
H04W 40/12 (2013.01); H04B 17/309 (2015.01); H04L 43/0888 (2013.01); H04L 45/123 (2013.01); H04L 45/124 (2013.01); H04L 45/125 (2013.01); H04W 40/28 (2013.01);
Abstract

A method for assessing path quality between a source node and a destination node, the method comprising, at a node: determining a first parameter and a first path classification of a first path having at least one link; determining a second parameter and a second path classification of a second path having at least one link; determining the quality of the first path based on the first parameter and the first path classification; determining the quality of the second path based on the second parameter and the second path classification; and comparing the quality of the first path and the quality of the second path thereby to determine the best quality path.


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