The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 2024
Filed:
Jun. 01, 2018
University of Florida Research Foundation, Incorporated, Gainesville, FL (US);
Azra Bihorac, Gainesville, FL (US);
Xiaolin Li, Gainesville, FL (US);
Parisa Rashidi, Gainesville, FL (US);
Panagote Pardalos, Gainesville, FL (US);
Tezcan Ozrazgat-Baslanti, Gainesville, FL (US);
Wiliam Hogan, Gainesville, FL (US);
Daisy Zhe Wang, Gainesville, FL (US);
Petar Momcilovic, Gainesville, FL (US);
Gloria Lipori, Gainesville, FL (US);
University of Florida Research Foundation, Incorporated, Gainesville, FL (US);
Abstract
Methods and systems disclosed herein utilize an automated analytics framework to implement a perioperative complication risk algorithm that uses existing clinical data in electronic health records to forecast patient-level probabilistic risk scores for eight major postoperative complications. An example method includes accessing health record data for a patient, normalizing the accessed health record data to generate a health record data set for the patient, transforming one or more features from the health record data set, selecting one or more transformed features from the health record data set, calculating risk probabilities for one or more complication risk categories based on the health record data set and the selected one or more features, calculating mortality risk probabilities for one or more mortality risk categories based on the calculated risk probabilities, and generating a personalized risk panel based on the calculated risk probabilities and the calculated mortality risk probabilities.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile