The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 2024
Filed:
Mar. 07, 2022
Applicant:
Vuereal Inc., Waterloo, CA;
Inventor:
Gholamreza Chaji, Waterloo, CA;
Assignee:
VueReal Inc., Waterloo, CA;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09G 3/00 (2006.01); G09G 3/3225 (2016.01);
U.S. Cl.
CPC ...
G09G 3/006 (2013.01); G09G 3/3225 (2013.01); G09G 2330/08 (2013.01); Y10T 29/49128 (2015.01);
Abstract
What is disclosed are structures and methods for testing and repairing emissive display systems. Systems are tested with use of temporary electrodes which allow operation of the system during testing and are removed afterward. Systems are repaired after identification of defective devices with use of redundant switching from defective devices to functional devices provided on repair contact pads.
Chaji, Gholamreza. (2024). Method of testing a microdevice in integrated systems (U.S. Patent No. 12014660). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12014660
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile