The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 2024
Filed:
Oct. 01, 2020
Applicant:
Carnegie Mellon University, Pittsburgh, PA (US);
Inventor:
Steven Huber, Pittsburgh, PA (US);
Assignee:
CARNEGIE MELLON UNIVERSITY, Pittsburgh, PA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 17/42 (2006.01); G01S 7/497 (2006.01); G01S 17/86 (2020.01); G01S 17/89 (2020.01); G05D 1/00 (2006.01); G06V 10/75 (2022.01); G06V 20/10 (2022.01); G06V 20/64 (2022.01);
U.S. Cl.
CPC ...
G06V 10/757 (2022.01); G01S 7/497 (2013.01); G01S 17/42 (2013.01); G01S 17/86 (2020.01); G01S 17/89 (2013.01); G05D 1/0011 (2013.01); G05D 1/0212 (2013.01); G05D 1/024 (2013.01); G06V 20/10 (2022.01); G06V 20/64 (2022.01);
Abstract
A method includes acquiring with a scanning device a scan frame including a point cloud comprising a first plurality of points and describing a spatial characteristic of an environment, attributing each of the first plurality of points with a spatial confidence metric, discarding a portion of the first plurality of points when the spatial confidence metric of at least one of the first plurality of points is below a predefined threshold value and directing a user of the scanning device to acquire a second point cloud approximately coincident with the discarded portion of the first plurality of points.