The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 2024
Filed:
Aug. 11, 2020
Molecular Devices (Austria) Gmbh, Hallein, AT;
Raimund Leitner, Puch/Hallein, AT;
Jan Steinbrener, Puch/Hallein, AT;
Abstract
Methods and systems for sample imaging via two-pass light-field reconstruction. In an exemplary method, a light-field image of a sample may be captured in a light-field plane. The light-field image may be forward-projected computationally to each of a plurality of z-planes in object space to generate a set of forward-projected z-plane images. Backward-projections computationally to the light-field plane of the same xy-region in object space from each z-plane image may be compared with the light-field image, to determine a respective degree of correspondence between the backward-projected xy-region from each of the z-plane images and the light-field image. For each different xy-region, at least one of the forward-projected z-plane images may be selected to contribute data for the different xy-region in a 2D or 3D object-space image of the sample.