The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 18, 2024

Filed:

Nov. 30, 2022
Applicant:

Fulian Precision Electronics (Tianjin) Co., Ltd., Tianjin, CN;

Inventors:

Duo Qiu, Tianjin, CN;

Jun-Lan Liu, Tianjin, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0653 (2013.01); G06F 3/0619 (2013.01); G06F 3/0683 (2013.01);
Abstract

An abnormality detecting system is provided. The abnormality detecting system includes a processor, a control module, a storage device and a monitoring module. The storage device includes a plurality of storage units. The processor is electrically connected to each storage unit of the plurality of storage units through the control module, the monitoring module is electrically connected to the processor, the control module and the each storage unit. The monitoring module obtains a monitoring result by monitoring a level state of signals generated by the control module, the each storage unit, and the processor; and the monitoring module confirming whether an abnormality occurs according to the monitoring result.


Find Patent Forward Citations

Qiu, Duo. (2024). Abnormality detecting system, motherboard, and electronic device (U.S. Patent No. 12014069). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12014069

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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