The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 2024
Filed:
Sep. 16, 2021
Applicant:
Samsung Sds Co., Ltd., Seoul, KR;
Inventors:
Joo Yeon Chung, Seoul, KR;
Min Sik Chu, Seoul, KR;
Seong Mi Park, Seoul, KR;
Kyong Hee Joo, Seoul, KR;
Assignee:
SAMSUNG SDS CO., LTD., Seoul, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 18/2413 (2023.01); G06T 7/00 (2017.01); G06V 10/32 (2022.01); G06V 10/40 (2022.01);
U.S. Cl.
CPC ...
G06F 18/2413 (2023.01); G06T 7/001 (2013.01); G06V 10/32 (2022.01); G06V 10/40 (2022.01); G06T 2207/30148 (2013.01);
Abstract
A method performed by a computing device for clustering an image according to an embodiment of the present disclosure includes performing a first clustering on feature vectors of the plurality of images, and performing a second clustering for feature vectors belonging to some clusters that do not satisfy a reference score among clusters formed as a result of the first clustering, wherein a clustering parameter of the second clustering and a clustering parameter of the first clustering are different from each other.