The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 18, 2024

Filed:

Jun. 16, 2022
Applicant:

Advanced Micro Devices, Inc., Santa Clara, CA (US);

Inventors:

Sudhanva Gurumurthi, Austin, TX (US);

Vilas Sridharan, Boston, MA (US);

Assignee:

Advanced Micro Devices, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/10 (2006.01); G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1004 (2013.01); G06F 11/0772 (2013.01); G06F 11/102 (2013.01); G06F 11/1068 (2013.01);
Abstract

A processing system includes a processing device coupled to a memory configured to check for and correct faults in requested data. In response to correcting the faults of the requested data, the memory sends the corrected data and unused check bits to the processing device as a plurality of fetch returns. The memory also sends a parity fetch based on the corrected data and one or more operations to the processing device. After receiving the plurality of fetch returns and the unused check bits, the processing device checks each fetch return for faults based on the unused check bits. In response to determining that a fetch return includes a fault, the processing device erases the fetch return and reconstructs the fetch return based on one or more other received fetch returns and the parity fetch.


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