The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 18, 2024

Filed:

Apr. 16, 2020
Applicant:

Renesas Electronics Corporation, Tokyo, JP;

Inventor:

Shinji Ishikawa, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 19/406 (2006.01); G06F 17/18 (2006.01);
U.S. Cl.
CPC ...
G05B 19/406 (2013.01); G06F 17/18 (2013.01); G05B 2219/34465 (2013.01);
Abstract

It is an object of the present invention to provide a technique capable of easily extracting a section signal of a specific sub-process. The anomaly detection system includes an extraction unit for extracting a specific subsequence to be an object of anomaly detection from among a plurality of subsequences from a composite sequence included in a monitor signal. The extraction unit determines an optimal warping path from the composite sequence and a reference sequence, which is an example of the composite sequence acquired in advance, by a dynamic time warping method. The extraction unit identifies a start point and an end point of a specific subsequence based on the optimal warping path and the start point and end point of the subsequence of the reference sequence. The extraction unit extracts a specific subsequence based on a start point and an end point of the specific subsequence.


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