The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 18, 2024

Filed:

Aug. 12, 2019
Applicant:

Miltenyi Biotec B.v. & Co. KG, Bergisch Gladbach, DE;

Inventor:

Rainer Uhl, Munich, DE;

Assignee:

Miltenyi Biotec B.V. & CO. KG, Bergisch Gladbach, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G02B 21/02 (2006.01); G02B 21/08 (2006.01); G02B 21/24 (2006.01); G02B 21/26 (2006.01); G02B 27/14 (2006.01);
U.S. Cl.
CPC ...
G02B 21/241 (2013.01); G02B 21/02 (2013.01); G02B 21/08 (2013.01); G02B 21/26 (2013.01); G02B 27/141 (2013.01);
Abstract

A microscope device includes an objective (); an actuator () for adjustment of a distance in a focusing direction z, an absolute z-position detector () for measuring a z-position. The device further includes an autofocus light source (); a first optical arrangement () for generating a focused spot () of autofocus light from the light source in the backfocal plane () of the objective () at a position offset from the optical axis of the objective by a lateral offset distance (d) The objective generates a collimated incoming beam () of autofocus light, which is directed at an oblique angle (β) relative to the optical axis () of the objective onto the substrate. The microscope may further include a second optical arrangement () for generating collimated outgoing beams () of autofocus light and directing the collimated outgoing beam onto a detector-array ().


Find Patent Forward Citations

Loading…