The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 2024
Filed:
Sep. 30, 2020
Shandong University, Shandong, CN;
Shucai Li, Jinan, CN;
Bin Liu, Jinan, CN;
Zhengfang Wang, Jinan, CN;
Peng Jiang, Jinan, CN;
Fengkai Zhang, Jinan, CN;
Hanchi Liu, Jinan, CN;
SHANDONG UNIVERSITY, Jinan, CN;
Abstract
A multi-scale inspection and intelligent diagnosis system and method for tunnel structural defects includes: a traveling section; a supporting section, disposed on the traveling section, and including a rotatable telescopic platform, where two mechanical arms working in parallel are disposed on the rotatable telescopic platform; an inspection section, mounted on the supporting section, and configured to perform multi-scale inspection on surface defects and internal defects in different depth ranges of a same position of a tunnel structure, and transmit inspected defect information to a control section; and the control section, configured to: construct a deep neural network-based defect diagnosis model; construct a data set by using historical surface defect and internal defect information, and train the deep neural network-based defect diagnosis model; and receive multi-scale inspection information in real time, and automatically recognize types, positions, contours, and dielectric attributes of the internal and surface defects.