The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 2024
Filed:
Dec. 12, 2022
Applicant:
Cypress Semiconductor Corporation, San Jose, CA (US);
Inventors:
Aidan Smyth, Miliptas, CA (US);
Victor Simileysky, San Jose, CA (US);
Kiran Uln, Pleasanton, CA (US);
Assignee:
Cypress Semiconductor Corporation, San Jose, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 3/48 (2006.01); G01S 3/74 (2006.01); G01S 11/06 (2006.01); G06N 20/00 (2019.01); H04B 7/0413 (2017.01); H04B 7/06 (2006.01); H04B 17/327 (2015.01);
U.S. Cl.
CPC ...
G01S 3/48 (2013.01); G01S 3/74 (2013.01); G01S 11/06 (2013.01); G06N 20/00 (2019.01); H04B 7/0413 (2013.01); H04B 7/0691 (2013.01); H04B 7/0697 (2013.01); H04B 17/327 (2015.01);
Abstract
An example method for estimating the angle-of-arrival (AoA) and other parameters of radio frequency (RF) signals that are received by an antenna array comprises: receiving a plurality of radio frequency (RF) signal power measurements by a plurality of antenna elements at a plurality of RF channels; computing, by applying a machine learning model to the plurality of RF signal power measurements, an estimated RF signal parameter value; and outputting the RF signal parameter value.