The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 18, 2024

Filed:

Mar. 07, 2017
Applicants:

Yokogawa Fluence Analytics, Inc., Stafford, TX (US);

The Administrators of the Tulane Educational Fund, New Orleans, LA (US);

Inventors:

Wayne Frederick Reed, New Orleans, LA (US);

Alex Reed, New Orleans, LA (US);

Michael Felix Drenski, New Orleans, LA (US);

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/10 (2006.01); G01N 11/00 (2006.01); G01N 11/08 (2006.01); G01N 11/14 (2006.01); G01N 21/31 (2006.01); G01N 21/47 (2006.01); G01N 35/08 (2006.01);
U.S. Cl.
CPC ...
G01N 35/1095 (2013.01); G01N 11/08 (2013.01); G01N 11/14 (2013.01); G01N 21/31 (2013.01); G01N 35/085 (2013.01); G01N 2011/0006 (2013.01); G01N 2021/4711 (2013.01);
Abstract

Devices and methods for rapidly and incrementally or continuously, measuring rheological properties of polymers under different shear rates. The device includes a pump configured to accept a continuous stream of sample solution during an interval of time, an injector configured to inject a flow of the sample solution through two or more viscometers, and a computing and processing device configured to monitor and measure rheological properties of the solution under at least two shear rates simultaneously in the two or more viscometers.


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