The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 2024
Filed:
Dec. 19, 2019
The Regents of the University of California, Oakland, CA (US);
Norman Ying Yao, Berkeley, CA (US);
Raymond Jeanloz, Berkeley, CA (US);
Thomas Mittiga, Berkeley, CA (US);
Prabudhya Bhattacharyya, Berkeley, CA (US);
Thomas J. Smart, Berkeley, CA (US);
Francisco Machado, Berkeley, CA (US);
Bryce Kobrin, Berkeley, CA (US);
Soonwon Choi, Berkeley, CA (US);
Joel Moore, Berkeley, CA (US);
Satcher Hsieh, Berkeley, CA (US);
Chong Zu, Berkeley, CA (US);
The Regent of the University of California, Oakland, CA (US);
Abstract
A pressure chamber has a chamber wall. The chamber wall includes a sensor integrated within the chamber wall, wherein the sensor integrated in the chamber wall comprises defects. A method of determining an effect of pressure on a material is further described. The method includes applying pressure to a material within a pressure chamber and to a pressure chamber wall of the pressure chamber, where the pressure chamber wall has defects. A signal from the defects is sensed while the material and the pressure chamber wall are under pressure. A property of the material is determined based on the sensed signal.