The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 2024
Filed:
Nov. 06, 2019
Uster Technologies Ag, Uster, CH;
Peyman Dehkordi, Knoxville, TN (US);
Kent A. Rinehart, Knoxville, TN (US);
David Dickson McAlister, III, Knoxville, TN (US);
Uster Technologies AG, Uster, CH;
Abstract
An apparatus () for optically characterizing a textile sample () comprises a presentation subsystem () comprising a viewing window (). A radiation subsystem () comprises a radiation source () for directing a first, ultraviolet radiation () and a second, visible radiation () toward the sample (), and causing the sample () to produce a fluorescent radiation () and a reflected radiation (). A sensing subsystem () comprises an imager () for capturing the fluorescent radiation () and the reflected radiation () in an array of pixels (). A control subsystem () comprises a processor () for controlling the presentation subsystem (), the radiation subsystem (), and the sensing subsystem (), and for creating a fluorescent and reflected radiation image () containing both spectral information and spatial information in regard to the fluorescent radiation () and the reflected radiation ().