The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 2024
Filed:
Jul. 11, 2022
Korea Institute of Science and Technology, Seoul, KR;
Yong Bok Lee, Seoul, KR;
Wonil Kwak, Seoul, KR;
Yunseok Ha, Seoul, KR;
Yeong-do Lee, Seoul, KR;
Jeon Kook Lee, Seoul, KR;
Korea Institute of Science and Technology, Seoul, KR;
Abstract
The present disclosure provides an Anderon meter for cryogenic environment including a housing; a control arm installed on an inner circumference of the housing rotatably relative to the housing, and including a pressing portion; and a clamp including a contact portion on a side and an assembly portion on an opposite side, wherein the contact portion is in contact with the pressing portion so that the contact portion is pressed by the pressing portion, and the assembly portion is coupled to an inner circumference of the bearing by interference fit, wherein the pressing portion presses the contact portion by the control of an amount of relative rotation of the control arm and the assembly portion is coupled to the inner circumference of the bearing by interference fit to determine friction characteristics between the inner race of the bearing and the assembly portion.