The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 18, 2024

Filed:

Mar. 12, 2020
Applicant:

Endress+hauser Se+co. KG, Maulburg, DE;

Inventors:

Marc Andreas Schlachter, Wehr, DE;

Wolfgang Trunzer, Lörrach, DE;

Assignee:

Endress+Hauser SE+Co. KG, Maulburg, DE;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01D 21/02 (2006.01); G01D 3/08 (2006.01); G01D 11/24 (2006.01); G01D 11/30 (2006.01);
U.S. Cl.
CPC ...
G01D 3/08 (2013.01); G01D 11/24 (2013.01); G01D 11/30 (2013.01); G01D 21/02 (2013.01);
Abstract

An add-on module for a field device for measuring and/or monitoring at least one measurement variable, wherein a portion of the field device adjacent the process is exposed to process conditions at the site of use and a portion of the field device opposite the process is exposed to ambient conditions at the site of use includes: at least one receiving device into which one measuring module can be inserted, wherein each measuring module acquires by measurement at least one ambient parameter and/or at least one effect of the ambient conditions on the measuring module; and an evaluation unit connected to the measuring module and configured to, based on the ambient parameter and/or effects acquired by the measuring module, determine an instantaneous stress acting on the field device and/or a total stress to which the field device has been exposed thus far during the period of use thereof.


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